Radio and Television Metrology takes the lead in compiling the quality map of Jiangsu one thousand s

Recently, Radio and Television Metrology (Wuxi) Co., Ltd. (referred to as "Wuxi Radio and Television Metrology") received a thank-you letter from the Jiangsu Provincial Administration for Market Regulation, thanking the company for its outstanding performance in the compilation of the Jiangsu one thousand six hundred and fifty industry system quality map. The letter particularly affirmed the company's outstanding contribution to the task of compiling the third-generation semiconductor industry chain inspection and testing map, demonstrating the profound strength and strong technical support capabilities of Radio and Television Metrology in key areas of the third-generation semiconductor industry. Thank you to the Jiangsu Provincial and Municipal Supervision Bureau for their precise efforts and active actions, closely following the pulse of industrial development in the province, and fully promoting the key task of building the one thousand six hundred and fifty industrial system. During this process, Wuxi Radio and Television Measurement Integrated Circuit Testing and Analysis Laboratory took the lead in carrying the banner of compiling the third-generation semiconductor industry chain inspection and testing map. The company quickly formed a cross departmental elite team and conducted in-depth research on relevant enterprises throughout the province. The team members, with solid professional knowledge and in-depth communication with front-line technical personnel of the enterprise, accurately collected massive first-hand data, explored industry details and potential needs, and after months of meticulous sorting and in-depth analysis, made outstanding contributions to the compilation of inspection and testing maps. This achievement not only assists in the compilation of the provincial quality map, but also accumulates valuable experience for better serving the industry in radio and television metrology. Looking ahead to the future, the company will closely follow the pulse of industrial development, continuously explore the value of the map, carry out joint research and development in response to existing technological bottlenecks, and deeply integrate into the wave of modern industrial system construction in Jiangsu. On the one hand, we will strengthen cooperation with universities and research institutes to accelerate the transformation of scientific research achievements into practical testing technologies; On the other hand, optimize the layout of the service network to ensure rapid response to the demands of frontline testing in the industry, and provide full support for the third-generation semiconductor industry from material innovation to terminal product upgrading, with more professional and efficient technical services to help Jiangsu's industry take off with high quality. Facing the complex processes and high-precision testing requirements of the third-generation semiconductor industry, the company continuously increases its research and development investment, introduces international cutting-edge testing equipment, and possesses full parameter testing capabilities for power semiconductor devices. In response to the high voltage, high temperature, and high power characteristics of power devices represented by SiC, Radio and Television Metrology adopts a new hardware design scheme and board manufacturing process, successfully achieving HV-HthreeTRB and HV-HAST testing capabilities of up to one thousandV and HTRG and HTGB testing capabilities of up to two hundred and twenty-five ℃, fully verifying the ultimate working stability of third-generation semiconductor power devices. For the application scenarios of SiC and GaN high-speed operation, the current testing technology and equipment based on Si devices are difficult to effectively simulate the working life of the stress state under device bias. Radio and Television Metrology actively develops various dynamic reliability verification technologies such as DRB, DGS, AC-HTC, DHTOL, etc., fully verifying the actual operational stability of third-generation semiconductor power devices. Provide parameter testing, reliability testing, and failure analysis for two-thirds of the leading power device enterprises in China. The number of cooperative customers in the field of third-generation semiconductor testing exceeds